SEMC Winter EM course – FIB-SEM

On February 5th, Bill Rice introduced the Focused Ion Beam (FIB) Scanning Electron Microscope (SEM). Many classical tomography studies have now turned to using the FIB-SEM to gain insight in the ultrastructure of cells and tissues. An advantage of this instrument is the finer Z-resolution detail over a larger continuous volume.

For more information see:
SEMC Winter EM Course

2018-02-05T21:10:25+00:00 February 5th, 2018|News|